*001849601
*00520190513231230.0
*007ta
*008150805s2012    no#           000 0 eng
*00901080cam a2200349 c 4500
*015  $a1222126$2nbf
*019  $bl
*020  $a9788251927765$qib.
*035  $a(EXLNZ-47BIBSYS_NETWORK)991213063134702201
*035  $a(NO-LaBS)13467848(bibid)
*035  $a(NO-TrBIB)121306313
*035  $a121306313-47bibsys_network
*040  $aNO-OsNB$bnob$ekatreg
*042  $anorbibl
*044  $cno
*080  $a658.5
*08204$a006.312$223
*08204$a670$qNoOU$223
*08274$a658.500285$qNO-OsNB$25/nor
*084  $aH.2.8$2acmccs
*24500$aData mining for zero-defect manufacturing$cKesheng Wang, Yi Wang, editors
*260  $aTrondheim$bTapir Academic Press$ccop. 2012
*300  $aXXI, 213 s.$bill.
*650 7$aDatagruvedrift$2tekord$_188783700
*650 7$aDatautvinning$0(NO-TrBIB)REAL007008$2noubomn$_206549700
*650 7$aProduksjon$0(NO-TrBIB)REAL008219$2noubomn$_203994400
*650 7$aProduksjon$2tekord$_190853700
*7001 $aWang, Kesheng$d1945-$0(NO-TrBIB)90283384$ered.$4aut$_14930000
*7001 $aWang, Yi$d1968-$0(NO-TrBIB)98077215$ered.$_111101200
*901  $a90
*913  $aNorbok$bNB
*999  $aoai:nb.bibsys.no:991213063134702202$b2021-11-14T20:54:05Z$z991213063134702202
^