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*1001 $aMarthinsen, Knut$0(NO-TrBIB)90095306$_37051300
*24510$aOptimized structure parameter determination from convergent beam electron diffraction$cKnut Marthinsen, Ragnvald Høier and Lars Nils Bakken
*260  $aTrondheim$bSINTEF, Applied Physics$c1990
*300  $aBl. 492-493$bill.
*4901 $aSINTEF report$vSTF19 A90026
*533  $aElektronisk reproduksjon$b[Norge]$cNasjonalbiblioteket Digital$d2010-07-05
*534  $aFotokopi fra: Proceedings of the XIIth International Congress for Electron Microscopy. San Francisco : San Francisco Press, c1990
*650 7$aElektroner$xSpredning$2tekord$_187773600
*650 7$aElektronmikroskopi$2tekord$_187335500
*7001 $aBakken, Lars Nils$0(NO-TrBIB)90526680$_49045200
*7001 $aHøier, Ragnvald$d1938-2009$0(NO-TrBIB)90095307$_35617200
*830 0$aSINTEF rapport (SINTEF. Målefysisk laboratorium : trykt utg.)$vSTF19 A90026$w998110210764702201$_14526900
*85641$3Fulltekst$uhttps://urn.nb.no/URN:NBN:no-nb_digibok_2010070508011$yNettbiblioteket$zDigital representasjon
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