*001851639
*00520250613133450.0
*007cr
*007ta
*008100826s1990    no            000 0 eng
*00900924cam a2200241 c 4500
*019  $bl
*020  $a8241102410
*035  $a(EXLNZ-47BIBSYS_NETWORK)999007699394702201
*035  $a(NO-LaBS)13900998(bibid)
*035  $a(NO-TrBIB)093288042
*035  $a(NO-TrBIB)900769939
*035  $a900769939-47bibsys_network
*040  $aNO-OsNB$bnob$ekatreg
*1001 $aSerck-Hanssen, Fin$d1929-2010$0(NO-TrBIB)90111205$_57649400
*24510$aMeasurement of thermal parameter by means of test chip on pin grid array (PGA2)$cFin Serck-Hanssen
*260  $aOslo$bSenter for industriforskning$c1990
*300  $a11 bl.$bill.
*4900 $aRapport / Senter for industriforskning$v900410-4
*533  $aElektronisk reproduksjon$b[Norge]$cNasjonalbiblioteket Digital$d2009-08-21
*85641$3Fulltekst$uhttps://urn.nb.no/URN:NBN:no-nb_digibok_2009082104029$yNettbiblioteket$zDigital representasjon
*901  $a80
*999  $aoai:nb.bibsys.no:999007699394702202$b2021-11-14T20:54:12Z$z999007699394702202
^