*001759994
*00520250613175142.0
*007ta
*008130620s1981    xxu           100 u eng d
*00901461cam a2200361 c 4500
*019  $bl
*020  $a0306406543
*035  $a(EXLNZ-47BIBSYS_NETWORK)998111068614702201
*035  $a(NO-LaBS)14582353(bibid)
*035  $a(NO-TrBIB)811106861
*035  $a811106861-47bibsys_network
*040  $aNO-TrBIB$bnob$ekatreg
*080  $a539.26
*080  $a539.26(063)
*080  $a543.422.8
*080  $a543.422.8(063)
*080  $a543.422.8(082)
*084  $aa3220r$qNoOU$2inspec
*084  $aa3320r$qNoOU$2inspec
*084  $aa6110f$qNoOU$2inspec
*24500$aEXAFS spectroscopy :$btechniques and applications$cedited by B. K. Teo and D. C. Joy
*260  $aNew York$bPlenum Press$cc1981
*300  $aviii, 275 s.$bill.
*500  $a"Based on the proceedings of a symposium on the applications of EXAFS to material science, held at the 1979 meeting of the Materials Research Society, November 26-30, 1979, in Boston, Massachusetts"
*650 7$aRøntgenspektroskopi$2tekord$vKongresser$_234524100
*653  $arøntgenspektra$afinstruktur$_103640900
*7001 $aJoy, David C.$0(NO-TrBIB)90249776$_103641000
*7001 $aTeo, B. K.$0(NO-TrBIB)90261178$_103641100
*7102 $aMaterials Research Society$0(NO-TrBIB)90245429$_74229400
*85642$3Miniatyrbilde$uhttps://contents.bibs.aws.unit.no/files/images/small/6/4/9780306406546.jpg$qimage/jpeg
*85642$3Omslagsbilde$uhttps://contents.bibs.aws.unit.no/files/images/large/6/4/9780306406546.jpg$qimage/jpeg
*901  $a80
*999  $aoai:nb.bibsys.no:998111068614702202$b2021-11-14T20:47:37Z$z998111068614702202
^