*001255890
*00520140505100545.0
*007ta
*008140505s1989 xx# 000 u eng d
*00900927cam a2200253 c 4500
*019 $bl
*020 $a8773981044
*035 $a(EXLNZ-47BIBSYS_NETWORK)999001616124702201
*035 $a(NO-LaBS)13926651(bibid)
*035 $a(NO-TrBIB)900161612
*035 $a900161612-47bibsys_network
*040 $aNO-TrBIB$bnob$ekatreg
*080 $a621.38-192
*1001 $aHansen, Claes$0(NO-TrBIB)90280501$_51435300
*24510$aActive and passive SMT-components :$breliability performance of SMD-devices after different soldering methods and environmental conditions : package cracking due to absorbed moisture$cClaes Hansen, Reiner B. Jensen, Tom Jørgensen
*260 $aHørsholm$bElektronikCentralen$c1989
*300 $a6 bl., 179 s.$bill.
*4901 $aECR$v233
*650 7$aElektronikk$xPålitelighet$2tekord$_188456700
*7001 $aJensen, Reiner B.$0(NO-TrBIB)90281953$_51435500
*7001 $aJørgensen, Tom$0(NO-TrBIB)90138934$_51435600
*830 $aECR$v233$w998011552154702201$_13379400
*901 $a80
*999 $aoai:nb.bibsys.no:999001616124702202$b2021-11-14T20:04:31Z$z999001616124702202
^